Duda, Richard O. <br/><br/>
Pattern classification /  
Richard O. Duda, Peter E. Hart, David G. Stork. 
 - Segunda edición 
 - New York:   Jhon Wiley & Sons,  2001 .  
 - 654 páginas:  ilustraciones;   19x26 cm 
<br/><br/>Bibliografía al final de los capítulos 
<br/><br/>Machine perception -- Pattern recognition systems -- The design cycle -- Learning and adaptation -- Bayesian decision theory -- Maximun-likelihood and bayesian parameter estimation -- Nonparametric techhiques -- Linear discriminant functions -- Multilayer neural networks -- Stochastic methods -- Nonmetric methods -- Algorithm-independent machine learning -- Unsupervised learning and clustering -- Mathematical foundations 
<br/><br/><label>ISBN: </label>9780471056690 0471056693 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Sistemas de reconocimiento de datos
<br/><br/><label>Dewey Class. No.: </label>006.4  / D844