Elements of X-Ray diffraction /
Declaración de edición:tercera edición Publicado por : Pearson India Education Services, (India:) Detalles físicos: 652 páginas: ilustraciones; 18x24 cm ISBN:9789332535169. Año : 2014Tipo de ítem | Biblioteca actual | Colección | Signatura | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
---|---|---|---|---|---|---|---|
![]() |
Biblioteca Jorge Franco Vélez Colección General | General | 539.7222 C967 Ej.1 (Navegar estantería (Abre debajo)) | Disponible | 20816 |
Properties of X-Rays -- Geometry of crystals -- DiffractionI: geometry -- Diffraction II: Intensities of diffracted beams -- Diffraction III: Real samples -- Diffraction measurements -- Powder photographs -- Laue photographs -- Phase identification by X-Ray diffraction -- Determination of crystal structure -- Phase-diagram determination -- Quantitative phase analysis -- Precise parameter measurements -- Structure of polyrystalline aggregates -- Stress measurement -- Orientation of single crystals -- Crystal quality -- Poymers -- Small angle scattering -- Transmission electron microscopy -- Appendix: Electron and neutorn diffraction -- Appendix: Lattice geometry -- Appendix: The rhombohedral-hexagonal transformation -- Appendix: X-Ray wavelengths -- Appendix: Quadratic forms of miller indices -- Appendix: Atomic scattering factors -- Appendix: Multiplicity factors for the powder method -- Appendix: Lorentz-polarization factor -- Appendix: Data for calculation of the temperature factor
No hay comentarios en este titulo.