Properties of X-Rays -- Geometry of crystals -- DiffractionI: geometry -- Diffraction II: Intensities of diffracted beams -- Diffraction III: Real samples -- Diffraction measurements -- Powder photographs -- Laue photographs -- Phase identification by X-Ray diffraction -- Determination of crystal structure -- Phase-diagram determination -- Quantitative phase analysis -- Precise parameter measurements -- Structure of polyrystalline aggregates -- Stress measurement -- Orientation of single crystals -- Crystal quality -- Poymers -- Small angle scattering -- Transmission electron microscopy -- Appendix: Electron and neutorn diffraction -- Appendix: Lattice geometry -- Appendix: The rhombohedral-hexagonal transformation -- Appendix: X-Ray wavelengths -- Appendix: Quadratic forms of miller indices -- Appendix: Atomic scattering factors -- Appendix: Multiplicity factors for the powder method -- Appendix: Lorentz-polarization factor -- Appendix: Data for calculation of the temperature factor